Unfolding procedure for AMS depth profiling
نویسنده
چکیده
Accelerator mass spectrometry measures the depth profiles of material concentration in solid samples. Crater edge effects affect the experimental data when the secondary ions are sputtered from the sidewalls of the produced crater. We present a simple mathematical unfolding procedure that removes the perturbing contribution from the measured depth profile data. Application of this procedure to experimental data is also presented.
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